3

Kelvin probe force microscopy of semiconductor surface defects

Year:
2004
Language:
english
File:
PDF, 475 KB
english, 2004
20

Microscopic characterization of individual grain boundaries in Cu-III–VI2 chalcopyrites

Year:
2007
Language:
english
File:
PDF, 286 KB
english, 2007
24

Amplitude or frequency modulation-detection in Kelvin probe force microscopy

Year:
2003
Language:
english
File:
PDF, 189 KB
english, 2003
28

Surface potential of chalcopyrite films measured by KPFM

Year:
2006
Language:
english
File:
PDF, 458 KB
english, 2006
35

[Springer Series in Surface Sciences] Kelvin Probe Force Microscopy ||

Year:
2012
Language:
english
File:
PDF, 803 KB
english, 2012